عنوان
پدید آورنده
موضوع
رده
TA 417 .23 .D54
TA
417
.
23
.
D54
کتابخانه
محل استقرار
73543
73542
آخر۲۷
English
)40(
Diffraction and imaging techniques in material science
Amsterdam, New York
North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland
1978
2 v.)xvii, 847 p., ]1[ fold. leaf of plates(: ill.; 23 cm
Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imagin
Includes bibliographical references and index
2nd, rev. ed
v.1. Electron microscopy.--v.2. Imaging and diffraction techniques
، Electron microscopy-- Congresses
، Electrons-- Diffraction-- Congresses
، Imaging systems-- Congresses
TA
417
.
23
.
D54
TI
editors, S. Amelinckx, R. Gevers, J. Van Landuyt
AU .S ,xkcnilemA
AU .R ,sreveG
AU nav .J ,tyudnaL
CO International Summer Course on Material Science)9691: Antwerp, Belgium(
04
04
