عنوان
پدید آورنده
موضوع
رده
TK 7874 .I3233a
TK
7874
.
I3233a
کتابخانه
محل استقرار
119185
پائیز۸۷
English
)50(
Proceedings of the ... International Conference on Microelectronic Test Structures
New York, N.Y.
Institute of Electrical and Electronics Engineers
1989-
v.: ill.; 30 cm
Vols. for 1989 sponsored by the IEEE Electron Devices Society in Cooperation with the IEE; for 1990-)1992( by the Society
Vols. for )1996(- have title: Proceedings
Other title: ICMTS
Continues: IEEE International Conference on Microelectronic Test Structures. Proceedings of the ... IEEE International Conference on Microelectonic Test Structures
ISSN 1071-9032
Congresses ، Integrated circuits-- Testing
TK
7874
.
I3233a
AU
IEEE International Conference on Microelectornic Test Structures
CO IEEE Electron Devices Society
CO Institution of Electrical Engineers
TI
TI Microelectronic test structures
TI ICMTS
IEEE International Conference on Microelectronic Test Structures
05
