عنوان
پدید آورنده
موضوع
رده
TK 7874 .S533 1986
TK
7874
.
S533
1986
کتابخانه
محل استقرار
لاتين
by Narinder Singh
author
1956-
An artificial intelligence approach to test generation
Boston
Academic Press
1987
x, 193 p. : ill. ; 25 cm
مرجع به حساب نمي آيد
Integrated circuits - Very large scale integration - Testing - Data processing
Expert systems (Computer science)
Artificial intelligence
TK
7874
.
S533
1986
مولف
Singh, Narinder
